Capabilities
- S-parameter measurements: S11, S21, S12, and S22
- Reflection, transmission, insertion loss, return loss, and impedance-related measurements
- EMI shielding effectiveness analysis including SER, SEA, and SET calculations when paired with appropriate fixtures and data reduction methods
- Coaxial, fixture-based, waveguide, and guided free-space material characterization
- Thickness-normalized EMI performance metrics
- RF, microwave, and mmWave material screening through 110 GHz when configured with compatible extenders and fixtures